Localization algebras and deformations of Koszul algebras

We show that the center of a flat graded deformation of a standard Koszul algebra behaves in many ways like the torus-equivariant cohomology ring of an algebraic variety with finite fixed-point set. In particular, the center acts by characters on the deformed standard modules, providing a "localization map." We construct a universal graded deformation, and show that the spectrum of its center is supported on a certain arrangement of hyperplanes which is orthogonal to the arrangement coming the Koszul dual algebra. This is an algebraic version of a duality discovered by Goresky and MacPherson between the equivariant cohomology rings of partial flag varieties and Springer fibers; we recover and generalize their result by showing that the center of the universal deformation for the ring governing a block of parabolic category $\mathcal{O}$ for $\mathfrak{gl}_n$ is isomorphic to the equivariant cohomology of a Spaltenstein variety. We also identify the center of the deformed version of the "category $\mathcal{O}$" of a hyperplane arrangement (defined by the authors in a previous paper) with the equivariant cohomology of a hypertoric variety.Comment: 39 pages; v3: final versio

Heavy Ion Test Report for the AD9364 RF Transceiver

The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibility of the AD9364 from Analog Devices

RH1021BMH-10 Precision 10 V Reference Total Ionizing Dose Test Report

The purpose of this test was to validate the Analog Devices (ADI) RH1021BMH-10 flight lot for use in the fabrication of Europa Clipper Propulsion subsystem flight hardware. This test shall serve as the radiation lot acceptance test (RLAT) for this flight lot with wafer lot number 769658.1 and lot date code (LDC) 1430A. Low dose rate (LDR) irradiations were performed in this test so that the device susceptibility to enhanced low dose rate sensitivity (ELDRS) could be determined

Heavy Ion Test Report for the LTC6268-10 Operational Amplifier

The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibility of the LTC6268-10 from Linear Technology Corp

Single Event Effect Testing of the Micron MT46V128M8

The Micron MT46V128M8 was tested for single event effects (SEE) at the Texas AM University Cyclotron Facility (TAMU) in June of 2017. Testing revealed a sensitivity to device hang-ups classified as single event functional interrupts (SEFI) and possible soft data errors classified as single event upsets (SEU)

Single Event Transients in Voltage Regulators for FPGA Power Supply Applications

As with other bipolar analog devices, voltage regulators are known to be sensitive to single event transients (SET). In typical applications, large output capacitors are used to provide noise immunity. Therefore, since SET amplitude and duration are generally small, they are often of secondary importance due to this capacitance filtering. In low voltage applications, however, even small SET are a concern. Over-voltages may cause destructive conditions. Under-voltages may cause functional interrupts and may also trigger electrical latchup conditions. In addition, internal protection circuits which are affected by load as well as internal thermal effects can also be triggered from heavy ions, causing dropouts or shutdown ranging from milliseconds to seconds. In the case of FPGA power supplies applications, SETS are critical. For example, in the case of Actel FPGA RTAX family, core power supply voltage is 1.5V. Manufacturer specifies an absolute maximum rating of 1.6V and recommended operating conditions between 1.425V and 1.575V. Therefore, according to the manufacturer, any transient of amplitude greater than 75 mV can disrupt normal circuit functions, and overvoltages greater than 100 mV may damage the FPGA. We tested five low dropout voltage regulators for SET sensitivity under a large range of circuit application conditions

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools